The E.M. Unit is having JEOL's JSM-6300 Scanning Electron Microscope, which can serve biologists for their purpose as a conventional SEM and material scientists as analytical SEM to study surface topography and elemental X-ray microanalysis. It is attached with LN2 Dewar 129 eV detector and energy dispersive spectroscope (EDS) manufactured by Rontec, Germany, and WDX-400, wavelength dispersive spectroscope (WDS) manufactured by Oxford, U.K. The unit is having well equipped specimen preparation laboratories to support above mentioned facilities for both biologists and material scientists.
