The NanoScope IV Multimode Atomic force Microscope(AFM) /Scanning Probe Microscope (SPM)is the highest resolution SPM presently available at Kuwait University, Faculty of Science, Science Analytical Facilities, Electron Microscopy Unit. The combination of easy to use, powerful software and innovative hardware design gives the Multimode SPM the flexibility to easily acquire images on both the atomic and macroscopic scales. The microscope performs the full range of SPM techniques to measure surface characteristics including topography, elasticity, friction, adhesion, magnetic fields, and electrical fields.
The complete range of Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM) techniques is available with the Multimode SPM:
- Contact Mode AFM
- Phase Imaging Microscopy
- Electric Force
- Surface Potential Microscopy
- Lateral Force Microscopy (LFM)
- Nanoindenting/Scratching
- Force Volume
- Electrochemical Microscopy (ECSTM and ECAFM)
- Tapping Mode AFM
- Non-contact AFM
- Magnetic Force Microscopy (MFM)
- Lift Mode
- Force Modulation
- Scanning Thermal Microscopy (SThM)
- Force-Distance Measurements
- Scanning Tunnelling Microscopy (STM)